SIMS surface spectroscopy analysis C016 / 3813
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SIMS surface spectroscopy analysis C016 / 3813
SIMS surface spectroscopy analysis. Researcher using a secondary ion mass spectrometer (SIMS) to carry out surface analysis of various samples. This device is used to study solid-state surfaces and interfaces, including analyses of polymers, biological specimens, metals, and other materials. This Cameca IMS 5f dynamic SIMS is used to determine the depth distribution of elements in a material. It can identify materials from the lightest of elements up to those of 250 atomic mass units (amu). Photographed at the Solar Energy Research Facility (SERF) at the National Renewable Energy Laboratory (NREL), Golden, Colorado, USA
Science Photo Library features Science and Medical images including photos and illustrations
Media ID 9204197
© JIM YOST, NREL/US DEPARTMENT OF ENERGY/SCIENCE PHOTO LIBRARY
1900s 1990s 1996 Analysis Analytical Characterization And Measurement Colorado Device Environmental Scientist Experiment Golden Indoor Materials Science Materials Scientist National Renewable Energy Laboratory North American Nrel Physical Chemist Physical Chemistry Physicist Researcher Scientist Serf Solar Energy Research Facility Spectrometer Spectroscopy Staff Test Laboratory Sims
EDITORS COMMENTS
This print showcases a researcher utilizing the powerful tool of secondary ion mass spectrometry (SIMS) to conduct surface analysis on various samples. The SIMS device, specifically the Cameca IMS 5f dynamic SIMS, is employed at the Solar Energy Research Facility (SERF) located in Golden, Colorado, USA. With its ability to study solid-state surfaces and interfaces across a wide range of materials including polymers, biological specimens, metals, and more, this advanced technology plays a vital role in materials science research. The image captures an American male scientist engrossed in his experiment within the laboratory setting. His focused expression reflects his dedication as he delves into understanding the depth distribution of elements present in a material under investigation. Equipped with expertise and precision instruments like SIMS spectroscopy analysis tools, researchers like him contribute significantly to advancements in physical chemistry and physics. Photographed by JIM YOST from NREL/US DEPARTMENT OF ENERGY/SCIENCE PHOTO LIBRARY, this snapshot offers us a glimpse into the world of analytical science where measurements and characterization are key components for progress. As we marvel at this scene from the late 20th century - during the 1990s - it serves as a reminder of how far we have come technologically while highlighting our ongoing pursuit of unraveling scientific mysteries for practical applications such as renewable energy development at institutions like NREL's SERF facility.
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